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SS-EN ISO 3497

SS-EN ISO 3497

Inorganic Surface Coatings – Determination of Coating Thickness – X-Ray Spectrometric Methods. This standard describes X-ray spectrometric methods for measuring the thickness of inorganic surface coatings. It covers principles of X-ray fluorescence and X-ray diffraction, as well as equipment and procedures for conducting measurements. The standard provides guidance on sample preparation, instrument calibration, and interpretation of results.

Associated processes
Measurment of coating thickness

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